Measurement and modeling of silicon heterostructure devices /
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| Format: | Book |
| Language: | English |
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Boca Raton, FL :
CRC Press,
©2008.
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Table of Contents:
- Measurement and Modeling ; Overview: Measurement and Modeling; J.D. Cressler ; Best-Practice AC Measurement Techniques; R.A. Groves ; Industrial Application of TCAD for SiGe Development; D.C. Sheridan, J.B. Johnson, and R. Krishnasamy ; Compact Modeling of SiGe HBTs: HICUM; M. Schröter ; Compact Modeling of SiGe HBTs: MEXTRAM; S. Mijalkovic ; CAD Tools and Design Kits; S.E. Strang ; Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs; R. Singh ; Transmission Lines on Si; Y.V. Tretiakov ; Improved De-Embedding Techniques; Q. Liang.