Schroder, D. K. (1998). Semiconductor material and device characterization (Second edition.). John Wiley & Sons.
Chicago Style (17th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. Second edition. New York: John Wiley & Sons, 1998.
MLA (8th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. Second edition. John Wiley & Sons, 1998.
Warning: These citations may not always be 100% accurate.