Semiconductor material and device characterization /
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Main Author: | |
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Format: | Book |
Language: | English |
Published: |
New York
John Wiley & Sons
1998.
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Edition: | Second edition. |
Subjects: | |
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Item Description: | "A Wiley-Interscience publication." |
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Physical Description: | xxiv, 760 pages: illustrations; 24 cm. |
Bibliography: | Includes bibliographical references |
ISBN: | 0471241393 |