Characterization in compound semiconductor processing /

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Bibliographic Details
Other Authors: Strausser, Yale, McGuire, G. E.
Format: Book
Language:English
Published: New York Momentum Press 2010.
Series:Materials characterization series.
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Description
Physical Description:xvi, 199 pages: illustrations; 24 cm.
ISBN:1606500414 (hc)
9781606500415 (hc)