Gan, Z., Wong, W., & Liou, J. J. (2013). Semiconductor process reliability in practice. McGraw-Hill.
Chicago Style (17th ed.) CitationGan, Zhenghao, Waisum Wong, and Juin J. Liou. Semiconductor Process Reliability in Practice. New York: McGraw-Hill, 2013.
MLA (8th ed.) CitationGan, Zhenghao, et al. Semiconductor Process Reliability in Practice. McGraw-Hill, 2013.
Warning: These citations may not always be 100% accurate.