Scanning electrochemical microscopy /
"Scanning Electrochemical Microscopy (SECM) is an indispensable tool for the study of surface reactivity, and scientists are increasingly attracted to this method because of its simplicity of use and the quantitative results. The fast expansion of the SECM field during the last several years ha...
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その他の著者: | , |
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フォーマット: | 図書 |
言語: | English |
出版事項: |
Boca Raton, Fla.
CRC Press
c2012.
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版: | Second edition |
主題: | |
タグ: |
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目次:
- Introduction and principles / Allen J. Bard
- Instrumentation / Fu-Ren F. Fan, Allen J. Bard, and Peixin He
- Preparation of tips for scanning electrochemical microscopy / Fu-Ren F. Fan and Christophe Demaille
- Scanning electrochemical microscopic imaging / Fu-Ren F. Fan
- Theory / Michael V. Mirkin and Yixian Wang
- Heterogeneous electron transfer reactions / Shigeru Amemiya
- Visualizing and quantifying homogeneous chemical reactions in electrochemical processes / Patrick R. Unwin
- Charge transfer processes at the liquid-liquid interface / Michael V. Mirkin and Michael Tsionsky
- Imaging molecular transport across membranes / Henry S. White and Frederic Kanoufi
- Potentiometric probes / Guy Denuault, Geza Nagy, and Klara Toth
- Biotechnological applications / Benjamin R. Horrocks and Gunther Wittstock
- Scanning electrochemical microscopy of living cells / Janine Mauzeroll and Steen B. Schougaard
- Localized flux measurements and kinetic imaging at interfaces / Patrick R. Unwin and Julie V. Macpherson
- Applications of scanning electrochemical microscopy in corrosion research / Dennis E. Tallman and Mark B. Jensen
- Micro- and nanopatterning using scanning electrochemical microscopy / Daniel Mandler
- Application to electrocatalysis and photocatalysis and surface interrogation / Joaquin Rodriguez Lopez, Cynthia G. Zoski, and Allen J. Bard
- Hybrid scanning electrochemical techniques: methods and applications / Julie V. Macpherson and Christophe Demaille
- Additional recent applications and prospects / Allen J. Bard, Fernando Cortes Salazar, and Hubert H. Girault.