APA (7th ed.) Citation

Alexe, M., & Gruverman, A. (2004). Nanoscale characterisation of ferroelectric materials: Scanning probe microscopy approach. Springer.

Chicago Style (17th ed.) Citation

Alexe, M., and A. Gruverman. Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach. Berlin: Springer, 2004.

MLA (8th ed.) Citation

Alexe, M., and A. Gruverman. Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach. Springer, 2004.