Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
River Edge, NJ
World Scientific
2002
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| Series: | Selected topics in electronics and systems
v. 23 |
| Subjects: | |
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| Physical Description: | ix, 270 pages illustrations 25 cm. |
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| Bibliography: | Includes bibliographical references. |
| ISBN: | 9810248423 |