Physical principles of electron microscopy an introduction to TEM, SEM, and AEM /
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Main Author: | Egerton, Ray F. (Author) |
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Corporate Author: | SpringerLink (Online service) |
Format: | eBook |
Language: | English |
Published: |
Boston, MA
Springer
2005
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Subjects: | |
Online Access: | Click here to view the full text content |
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