Physical principles of electron microscopy an introduction to TEM, SEM, and AEM /

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Bibliographic Details
Main Author: Egerton, Ray F. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA Springer 2005
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by Egerton, Ray F.
Published 2005
Book
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by Egerton, Ray F.
Published 2005
Book