Aliev, T. (2007). Digital noise monitoring of defect origin. Springer Science+Business Media, LLC.
Chicago Style (17th ed.) CitationAliev, Telman. Digital Noise Monitoring of Defect Origin. Boston, MA: Springer Science+Business Media, LLC, 2007.
MLA (8th ed.) CitationAliev, Telman. Digital Noise Monitoring of Defect Origin. Springer Science+Business Media, LLC, 2007.
Warning: These citations may not always be 100% accurate.