Schubert, M. (2005). Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons. Springer.
Cita Chicago Style (17a ed.)Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Berlin, Heidelberg: Springer, 2005.
Cita MLA (8a ed.)Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Springer, 2005.
Precaución: Estas citas no son 100% exactas.