Schubert, M. (2005). Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons. Springer.
Chicagoスタイル(17版)引用形式Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Berlin, Heidelberg: Springer, 2005.
MLA(8版)引用形式Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Springer, 2005.
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