Schubert, M. (2005). Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons. Springer.
Chicago Style (17th ed.) CitationSchubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Berlin, Heidelberg: Springer, 2005.
MLA citiranjeSchubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Springer, 2005.
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