Schubert, M. (2005). Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons. Springer.
芝加哥风格引文Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Berlin, Heidelberg: Springer, 2005.
MLA引文Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Springer, 2005.
警告：这些引文格式不一定是100％准确.