APA ציטוט

Schubert, M. (2005). Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons. Springer.

Chicago Style (17th ed.) Citation

Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Berlin, Heidelberg: Springer, 2005.

ציטוט MLA

Schubert, Mathias. Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons. Springer, 2005.