Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /
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| Autor principal: | |
|---|---|
| Autor corporatiu: | |
| Format: | eBook |
| Idioma: | English |
| Publicat: |
Berlin, Heidelberg
Springer
2005.
|
| Col·lecció: | Springer Tracts in Modern Physics,
209 |
| Matèries: | |
| Accés en línia: | Click here to view the full text content |
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| 100 | 1 | |a Schubert, Mathias. |e author | |
| 245 | 1 | 0 | |a Infrared ellipsometry on semiconductor layer structures |b phonons, plasmons, and polaritons / |c by Mathias Schubert. |
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