Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /
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| Format: | E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer
2005.
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| Schriftenreihe: | Springer Tracts in Modern Physics,
209 |
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| Online Zugang: | Click here to view the full text content |
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| 245 | 1 | 0 | |a Infrared ellipsometry on semiconductor layer structures |b phonons, plasmons, and polaritons / |c by Mathias Schubert. |
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