Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /
Saved in:
| Main Author: | Schubert, Mathias (Author) |
|---|---|
| Corporate Author: | SpringerLink (Online service) |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg
Springer
2005.
|
| Series: | Springer Tracts in Modern Physics,
209 |
| Subjects: | |
| Online Access: | Click here to view the full text content |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Device physics of narrow gap semiconductors
by: Chu, Junhao
Published: (2010) -
Ellipsometry at the nanoscale /
Published: (2013) -
Transport in metal-oxide-semiconductor structures mobile ions effects on the oxide properties /
by: Bentarzi, Hamid
Published: (2011) - Mid-infrared semiconductor optoelectronics /
-
Basic semiconductor physics
by: Hamaguchi, Chihiro
Published: (2010)