Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Dades bibliogràfiques
Autor principal:	Schubert, Mathias (Autor)
Autor corporatiu:	SpringerLink (Online service)
Format:	eBook
Idioma:	English
Publicat:	Berlin, Heidelberg Springer 2005.
Col·lecció:	Springer Tracts in Modern Physics, 209
Matèries:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Accés en línia:	Click here to view the full text content
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