Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Xehetasun bibliografikoak
Egile nagusia:	Schubert, Mathias (Egilea)
Erakunde egilea:	SpringerLink (Online service)
Formatua:	eBook
Hizkuntza:	English
Argitaratua:	Berlin, Heidelberg Springer 2005.
Saila:	Springer Tracts in Modern Physics, 209
Gaiak:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Sarrera elektronikoa:	Click here to view the full text content
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

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