Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Schubert, Mathias (लेखक)
निगमित लेखक:	SpringerLink (Online service)
स्वरूप:	ई-पुस्तक
भाषा:	English
प्रकाशित:	Berlin, Heidelberg Springer 2005.
श्रृंखला:	Springer Tracts in Modern Physics, 209
विषय:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
ऑनलाइन पहुंच:	Click here to view the full text content
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