Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Opis bibliograficzny
1. autor:	Schubert, Mathias (Autor)
Korporacja:	SpringerLink (Online service)
Format:	E-book
Język:	English
Wydane:	Berlin, Heidelberg Springer 2005.
Seria:	Springer Tracts in Modern Physics, 209
Hasła przedmiotowe:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Dostęp online:	Click here to view the full text content
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

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