Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons /

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Detaylı Bibliyografya
Yazar:	Schubert, Mathias (Yazar)
Müşterek Yazar:	SpringerLink (Online service)
Materyal Türü:	Ekitap
Dil:	English
Baskı/Yayın Bilgisi:	Berlin, Heidelberg Springer 2005.
Seri Bilgileri:	Springer Tracts in Modern Physics, 209
Konular:	Engineering Optical materials Physical optics Surfaces (Physics) Chemistry
Online Erişim:	Click here to view the full text content
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

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