Analysis and design of resilient VLSI circuits mitigating soft errors and process variations /

Analysis and design of resilient VLSI circuits mitigating soft errors and process variations /

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Bibliographic Details
Main Author: Garg, Rajesh (Author)
Corporate Author: SpringerLink (Online service)
Other Authors: Khatri, Sunil P.
Format: eBook
Language:English
Published: Boston, MA Springer 2010.
Subjects:
Computer-aided design
Systems engineering
Integrated circuits > Very large scale integration
Online Access:Click here to view the full text content
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