Extreme statistics in nanoscale memory design

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Singhee, Amith, Rutenbar, Rob A.
Format: eBook
Language:English
Published: Boston, MA Springer 2010.
Series:Integrated Circuits and Systems,
Subjects:
Online Access:Click here to view the full text content
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Description
Physical Description:1 online resource digital.
ISBN:9781441966063
9781441966056
ISSN:1558-9412