Microprobe characterization of optoelectronic materials /
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York
Taylor & Francis
2003.
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| Series: | Optoelectronic properties of semiconductors and superlattices;
v. 17 |
| Subjects: | |
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| Physical Description: | xiv, 715 pages : illustrations ; c24 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 1560329416 |