Practical materials characterization /
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...
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| Format: | eBook |
| Language: | English |
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New York, NY
Springer New York
2014.
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| Online Access: | Click here to view the full text content |
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