Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.
Dyfyniad Arddull ChicagoNicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.
Dyfyniad MLANicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.