Cita APA (7a ed.)

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.

Cita Chicago Style (17a ed.)

Nicolici, Nicola, y Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.

Cita MLA (8a ed.)

Nicolici, Nicola, y Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.