APA-viite (7. p.)

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.

Chicago-viite (17. p.)

Nicolici, Nicola, ja Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.

MLA-viite (8. p.)

Nicolici, Nicola, ja Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.