Lua APA (7ú heag.)

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.

Lua i Stíl Chicago (17ú heag.)

Nicolici, Nicola, agus Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.

Lua MLA (8ú heag.)

Nicolici, Nicola, agus Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.

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