Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.
Chicagoスタイル(17版)引用形式Nicolici, Nicola, , Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.
MLA(8版)引用形式Nicolici, Nicola, , Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.
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