APA (7e ed.) Bronvermelding

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.

Chicago (17e ed.) Bronvermelding

Nicolici, Nicola, en Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.

MLA (8e ed.) Bronvermelding

Nicolici, Nicola, en Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.