Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.
Chicago Style (17th ed.) CitationNicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.
MLA引文Nicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.
警告:這些引文格式不一定是100%准確.