APA引文

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.

Chicago Style (17th ed.) Citation

Nicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.

MLA引文

Nicolici, Nicola, and Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.