APA引文

Nicolici, N., & Al-Hashimi, B. M. (2003). Power-constrained testing of VLSI circuits. Kluwer.

芝加哥风格引文

Nicolici, Nicola, 与 Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Boston: Kluwer, 2003.

MLA引文

Nicolici, Nicola, 与 Bashir M. Al-Hashimi. Power-constrained Testing of VLSI Circuits. Kluwer, 2003.

警告：这些引文格式不一定是100％准确.