Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Dades bibliogràfiques
Autor principal:	Nicolici, Nicola (Autor)
Altres autors:	Al-Hashimi, Bashir M.
Format:	Llibre
Idioma:	English
Publicat:	Boston Kluwer c2003
Col·lecció:	Frontiers in electronic testing ;
Matèries:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

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