Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Détails bibliographiques
Auteur principal:	Nicolici, Nicola (Auteur)
Autres auteurs:	Al-Hashimi, Bashir M.
Format:	Livre
Langue:	English
Publié:	Boston Kluwer c2003
Collection:	Frontiers in electronic testing ;
Sujets:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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