Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Bibliografski detalji
Glavni autor:	Nicolici, Nicola (Autor)
Daljnji autori:	Al-Hashimi, Bashir M.
Format:	Knjiga
Jezik:	English
Izdano:	Boston Kluwer c2003
Serija:	Frontiers in electronic testing ;
Teme:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
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