Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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書誌詳細
第一著者:	Nicolici, Nicola (著者)
その他の著者:	Al-Hashimi, Bashir M.
フォーマット:	図書
言語:	English
出版事項:	Boston Kluwer c2003
シリーズ:	Frontiers in electronic testing ;
主題:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
タグ:	タグ追加タグなし, このレコードへの初めてのタグを付けませんか!

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