Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Bibliografske podrobnosti
Glavni avtor:	Nicolici, Nicola (Author)
Drugi avtorji:	Al-Hashimi, Bashir M.
Format:	Knjiga
Jezik:	English
Izdano:	Boston Kluwer c2003
Serija:	Frontiers in electronic testing ;
Teme:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
Oznake:	Označite Brez oznak, prvi označite!

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