Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Bibliografiska uppgifter
Huvudupphovsman:	Nicolici, Nicola (Författare, medförfattare)
Övriga upphovsmän:	Al-Hashimi, Bashir M.
Materialtyp:	Bok
Språk:	English
Publicerad:	Boston Kluwer c2003
Serie:	Frontiers in electronic testing ;
Ämnen:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
Taggar:	Lägg till en tagg Inga taggar, Lägg till första taggen!

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