Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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書目詳細資料
主要作者:	Nicolici, Nicola (Author)
其他作者:	Al-Hashimi, Bashir M.
格式:	圖書
語言:	English
出版:	Boston Kluwer c2003
叢編:	Frontiers in electronic testing ;
主題:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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