Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

Sábháilte in:

Sonraí bibleagrafaíochta
Príomhchruthaitheoir:	Nicolici, Nicola (Údar)
Rannpháirtithe:	Al-Hashimi, Bashir M.
Formáid:	LEABHAR
Teanga:	English
Foilsithe / Cruthaithe:	Boston Kluwer c2003
Sraith:	Frontiers in electronic testing ;
Ábhair:	Integrated circuits, very large scale integration > Protection. Integrated circuits > Very large scale integration > Testing. Semiconductors > Thermal properties.
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

Míreanna comhchosúla

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