Debug automation from pre-silicon to post-silicon

Debug automation from pre-silicon to post-silicon

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated d...

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Bibliographic Details
Main Authors: Dehbashi, Mehdi (Author), Fey, Görschwin (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2015.
Subjects:
Engineering.
Microprocessors.
Electronic circuits.
Online Access:Click here to view the full text content
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Table of Contents:
  • Introduction
  • Preliminaries
  • Part I Debug of Design Bugs
  • Automated Debugging for Logic Bugs
  • Automated Debugging from Pre-Silicon to Post-Silicon
  • Automated Debugging for Synchronization Bugs
  • Part II Debug of Delay Faults
  • Analyzing Timing Variations
  • Automated Debugging for Timing Variations
  • Efficient Automated Speedpath Debugging
  • Part III Debug of Transactions
  • Online Debug for NoC-Based Multiprocessor SoCs
  • Summary and Outlook.

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