A study of Fowler-Nordheim injection mechanism for engineered tunnel barrier flash memory devices
There are three main components of the project. Firstly, the conventional flash memory is model by using Fowler-Nordheim concept. Then This original model is again modified to perform based on the Engineered Tunnel Barrier (ETB) flash memory. This latter model is then used the calculate the programm...
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| Format: | Thesis Book |
| Language: | English |
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Perlis, Malaysia
School of Microelectronic Engineering, Universiti Malaysia Perlis
2011
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