Fabrication of silicon nanowires using scanning electron microscope based electron beam lithography method /
The goal of this research work is to form and produce very small nanowires using a Top-Down Nanofabrication Method which involved Scanning Electron Microscope (SEM) based Electron Beam Litography (EBL) method.
שמור ב:
| מחבר ראשי: | |
|---|---|
| מחבר תאגידי: | |
| פורמט: | Thesis תכנה ספר אלקטרוני |
| שפה: | English |
| יצא לאור: |
Kangar
Universiti Malaysia Perlis (UniMAP)
2007.
|
| נושאים: | |
| תגים: |
הוספת תג
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: