Fabrication of silicon nanowires using scanning electron microscope based electron beam lithography method /
The goal of this research work is to form and produce very small nanowires using a Top-Down Nanofabrication Method which involved Scanning Electron Microscope (SEM) based Electron Beam Litography (EBL) method.
Saved in:
主要作者: | |
---|---|
企业作者: | |
格式: | Thesis 软件 电子书 |
语言: | English |
出版: |
Kangar
Universiti Malaysia Perlis (UniMAP)
2007.
|
主题: | |
标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: