Temperature cycling reliability test for a ball grid array (BGA) package using finite element analysis (FEA)
Sábháilte in:
Príomhchruthaitheoir: | Muhammad Nubli Bin Zulkifli (Údar) |
---|---|
Údar corparáideach: | Universiti Malaysia Perlis |
Formáid: | Tráchtas LEABHAR |
Teanga: | English |
Foilsithe / Cruthaithe: |
Kangar
Universiti Malaysia Perlis (UniMAP)
2008
|
Ábhair: | |
Clibeanna: |
Cuir clib leis
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
Míreanna comhchosúla
-
Ball grid array technolog : edited by John H Lau.
Foilsithe / Cruthaithe: (1995) -
Area array packaging handbook : manufacturing and assembly /
Foilsithe / Cruthaithe: (2002) -
Area array packaging materials : adhesive, paste and lead free /
de réir: Gilleo, Ken
Foilsithe / Cruthaithe: (2004) -
Area array packaging materials : adhesives, pastes and lead-free /
Foilsithe / Cruthaithe: (2004) -
Area array packaging handbook manufacturing and assembley
de réir: Gilleo, Ken
Foilsithe / Cruthaithe: (2002)