Silicon nanowire sensor from electron beam litography : design, fabrication and characterization /

This study demonstrates the process development of silicon nanowires (SiNWs) sensor requires both the fabrication of nanoscale diameter wires and standard integration to CMOS process. There are three objectives that applied to this research work. The first objective is to design masks using GDSII Ed...

תיאור מלא

שמור ב:
מידע ביבליוגרפי
מחבר ראשי: Siti Fatimah Abd Rahman (Author)
מחבר תאגידי: Universiti Malaysia Perlis
פורמט: Thesis ספר
שפה:English
יצא לאור: Perlis, Malaysia School of Microelectronic 2011.
נושאים:
תגים: הוספת תג
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